EM-Product
Showing 2647–2655 of 3988 results
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Probe with sharp curved hook tip and round handle
Value-Tec VP6 probe with sharp curved hook tip, round handle – 410 stainless steel (each)
£2.06 Add to basket
Probe with sharp curved hook tip and round handle
Value-Tec VP6 probe with sharp curved hook tip, round handle – 410 stainless steel (each)
£2.06 -
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
Price On Request £0.00 Add to basket
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
£0.00Price On Request -
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
Price On Request £0.00 Add to basket
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
£0.00Price On Request -
Prober shuttle with eight probers and three axis substage
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics in a 19″ electronics rack, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles, iProbe control software and an operator’s handbook.
Price On Request £0.00 Add to basket
Prober shuttle with eight probers and three axis substage
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics in a 19″ electronics rack, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles, iProbe control software and an operator’s handbook.
£0.00Price On Request -
Prober shuttle with two probers (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
Prober shuttle with two probers (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
£0.00Price On Request -
Prober shuttle with two probers and three axis substage (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
Prober shuttle with two probers and three axis substage (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
£0.00Price On Request -
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
£0.00Price On Request -
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
Price On Request £0.00 Add to basket
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
£0.00Price On Request