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ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
£0.00Price On Request -
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
Price On Request £0.00 Add to basket
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
£0.00Price On Request -
ProbeWorkstation with four probes (on PS8 platform)
ProbeWorkstation with Four Probes (on PS8 Platform). A powerful, dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier- iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack- Twelve pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket
ProbeWorkstation with four probes (on PS8 platform)
ProbeWorkstation with Four Probes (on PS8 Platform). A powerful, dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier- iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack- Twelve pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
£0.00Price On Request -
ProbeWorkstation with six probes
ProbeWorkstation with Six Probes – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with six probes
ProbeWorkstation with Six Probes – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
ProbeWorkstation with six probes and current imaging module
ProbeWorkstation with Six Probes and Current Imaging Module – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with six probes and current imaging module
ProbeWorkstation with Six Probes and Current Imaging Module – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request