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Prober shuttle with two probers and three axis substage (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
Prober shuttle with two probers and three axis substage (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
£0.00Price On Request -
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
£0.00Price On Request -
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
Price On Request £0.00 Add to basket
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
£0.00Price On Request -
ProbeWorkstation with four probes (on PS8 platform)
ProbeWorkstation with Four Probes (on PS8 Platform). A powerful, dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier- iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack- Twelve pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket
ProbeWorkstation with four probes (on PS8 platform)
ProbeWorkstation with Four Probes (on PS8 Platform). A powerful, dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier- iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack- Twelve pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
£0.00Price On Request -
ProbeWorkstation with six probes
ProbeWorkstation with Six Probes – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with six probes
ProbeWorkstation with Six Probes – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
ProbeWorkstation with six probes and current imaging module
ProbeWorkstation with Six Probes and Current Imaging Module – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket
ProbeWorkstation with six probes and current imaging module
ProbeWorkstation with Six Probes and Current Imaging Module – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
£0.00Price On Request -
PS-006 planetary gear table
Consisting of base plate for connection to the tilt and height adjustable specimen table of the CCU-010 base unit. Specimen holders for six large (Ø 25.4mm) or six small (Ø12.7mm) SEM pin stubs. DC micro-motor for rotation and planetary movement, quartz sensor (centre), speed control: 0-100%, rotation: 0-20rpm approximately, planets: 0-65rpm approximately
Price On Request £0.00 Add to basket
PS-006 planetary gear table
Consisting of base plate for connection to the tilt and height adjustable specimen table of the CCU-010 base unit. Specimen holders for six large (Ø 25.4mm) or six small (Ø12.7mm) SEM pin stubs. DC micro-motor for rotation and planetary movement, quartz sensor (centre), speed control: 0-100%, rotation: 0-20rpm approximately, planets: 0-65rpm approximately
£0.00Price On Request -
PS15C pin stub swivel mount sample holder with one S-Clip – pin
EM-Tec PS15C Pin stub swivel mount sample holder with 1 x S-Clip – pin (each)
£43.66 Add to basket
PS15C pin stub swivel mount sample holder with one S-Clip – pin
EM-Tec PS15C Pin stub swivel mount sample holder with 1 x S-Clip – pin (each)
£43.66 -
PS18 mini-swivel split mount vice for up to 8mm – pin
EM-Tec PS18 mini-swivel, split mount vice for up to 8mm, aluminium – pin (each)
£56.26 Add to basket
PS18 mini-swivel split mount vice for up to 8mm – pin
EM-Tec PS18 mini-swivel, split mount vice for up to 8mm, aluminium – pin (each)
£56.26 -
PS2 probe set with PV1 probe holder and NAS set
Micro-Tec PS2 probe set with Micro-Tec PV1 probe holder and Micro-Tec NAS set of eight fine pointed angled stainless steel needle probes (set)
£11.94 Add to basket
PS2 probe set with PV1 probe holder and NAS set
Micro-Tec PS2 probe set with Micro-Tec PV1 probe holder and Micro-Tec NAS set of eight fine pointed angled stainless steel needle probes (set)
£11.94 -
PS3 probe set with PV1 probe holder and BS set
Micro-Tec PS3 probe set with Micro-Tec PV1 probe holder and Micro-Tec BS set of eight fine pointed straight black enameled steel needle probes (set)
£10.94 Add to basket
PS3 probe set with PV1 probe holder and BS set
Micro-Tec PS3 probe set with Micro-Tec PV1 probe holder and Micro-Tec BS set of eight fine pointed straight black enameled steel needle probes (set)
£10.94 -
PS4 base – prober shuttle with four probers
PS4 Base – Prober Shuttle with Four Probers – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes control electronics- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
PS4 base – prober shuttle with four probers
PS4 Base – Prober Shuttle with Four Probers – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes control electronics- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
£0.00Price On Request -
PS4 pro – prober shuttle with four probers and substage
PS4 Pro – Prober Shuttle with Four Probers and three axis substage – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
PS4 pro – prober shuttle with four probers and substage
PS4 Pro – Prober Shuttle with Four Probers and three axis substage – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
£0.00Price On Request -
PS4 starter – prober shuttle with four probers
PS4 Starter – Prober Shuttle with Four Probers – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes a single set of control electronics combined with a multiplexer- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket
PS4 starter – prober shuttle with four probers
PS4 Starter – Prober Shuttle with Four Probers – An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes a single set of control electronics combined with a multiplexer- a joypad- a vacuum flange- a vacuum feedthrough- sample probe needles and an operator’s handbook.
£0.00Price On Request